The SHR is an ideal low-cost high-precision instrument for measuring laser wavelength in a large field of laser applications, as well as in the process of adjustment and testing of solid-state lasers, diode lasers, dye lasers and OPOs.
The SHR optical scheme is based on an Echelle diffraction grating operating in high spectrum orders and a linear image sensor used as a detector. The instrument does not contain any movable elements; powering and control are performed from a computer via the Full-Speed USB interface. Analyzed light hits the SHR input slit through an optical fiber fitted with an attenuator.
The SHR allows quick and easy measuring of absolute wavelength value of both CW and pulsed lasers with outstanding precision of ± 3 pm within a widest spectral range of 190-1100 nm, as well as detecting FWHM of the analyzed line with resolution of 30 000 (λ/Δλ<FWHM) which constitutes from 6 pm for the UV spectrum range to 40 pm for the IR. The SHR also ensures on-line monitoring of the above values in the process of tuning the analyzed wavelength.
The SHR spectrometer is not directly used for analysis of populated spectra; however, it can be applied in analysis of narrow spectral intervals within the spectral width of the Echelle order – from 0,5 nm in the UV spectrum range (190 nm) to 18 nm in the IR (1200 nm), preliminarily separated with a filter or any other spectral device.
