NanoFlex is an Atomic Force microscope combined with Raman Confocal Spectrometer and Optical Microscope.  It is an outstanding example of multiple advanced techniques inherent in one instrument..

The NanoFlex design allows you to easily combine chemical information obtained from high spectral and spatial resolving Raman spectroscopy with advanced nanoscale AFM characterization. This provides unambiguous correlation between the topography of the surface and its chemical composition and crystallographic structure.

WHERE TO USE:

• Chemistry. Combination scanning probe microscopy methods and Raman spectroscopy methods allows the analysis of the composition and structure of organic and inorganic substances, traditional and composite materials;

• Physics. Investigation of physical parameters of surfaces and subsurface layers for different substances and materials;

• Biology. Study of tissues, cells and their structures, biological molecules and interactions between them. Study of interactions between implants and biological objects;

• Interdisciplinary Research. Research in the field of nanotechnologies, microelectromechanical systems (MEMS), pharmaceuticals, materials science, mineralogy, geology, gemology, forensic science, analysis of art objects, etc.

ADVANTAGES OF "NanoFlex":

• Joint operation of the scanning stage and scanning head;
• Simultaneous collection of topographic information of the surface and spectral characteristics;
• Obtaining the spectrum at each point of the scan surface;
• Use of traditional methods of optical microscopy;
• High thermal stability due to the horizontal arrangement of the opto-mechanical unit;
• Integration with upright or inverted optical microscopes to work with transparent and non-transparent samples;
• Single controller and software ensure simultaneous operation of all NanoFlex units.
  

NanoFlex combines :

• Scanning Probe Microscope (Atomic Force Microscope)
• Conventional optical microscope, upright or inverted
• Confocal Laser Microscope
• Raman Spectrometer
• Fluorescence Spectrometer

 

Specifications in PDF format